• DocumentCode
    1257527
  • Title

    Modeling Dielectric Constant of Semiconductor Nanocrystals

  • Author

    Li, M. ; Li, H.

  • Author_Institution
    Sch. of Phys. & Electr. Inf., Huaibei Normal Univ., Huaibei, China
  • Volume
    11
  • Issue
    5
  • fYear
    2012
  • Firstpage
    1004
  • Lastpage
    1008
  • Abstract
    A simple and unified model has been established for size- and composition-dependent dielectric constant ε(x,D) based on a size-dependent melting-temperature model, where x is the fraction of composition, D denotes the diameter of nanoparticles and nanowires, and the thickness of thin films. It demonstrates that depending on the dimension of nanocrystals, ε(x,D) decreases with different trend as D drops, while ε(x,D) is a nonlinear function of x. The theoretical prediction agrees approximately with experimental and computer simulation results of semiconductor nanocrystals in single phase or multiphases.
  • Keywords
    melting; nanoparticles; nanowires; permittivity; semiconductors; size effect; composition fraction; composition-dependent dielectric constant; computer simulation; multiphases; nanocrystal dimension; nanoparticle diameter; nanowire diameter; nonlinear function; semiconductor nanocrystals; single phase; size-dependent dielectric constant; size-dependent melting-temperature model; thin film thickness; unified model; Dielectric constant; Metals; Nanocrystals; Nanowires; Physics; Predictive models; Alloy; component effect; dielectric constant; semiconductor; size effect;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2012.2211382
  • Filename
    6257499