Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM

Author

Scott, J. ; McVitie, S. ; Ferrier, R.P. ; Heydon, G.P. ; Rainforth, W.M. ; Gibbs, M.R.J. ; Tucker, J.W. ; Davies, H.A. ; Bishop, J.E.L.

Author_Institution

Dept. of Phys. & Astron., Glasgow Univ., UK

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

3986

Lastpage

3988

Abstract

Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM

Keywords

amorphous magnetic materials; boron alloys; ferromagnetic materials; image reconstruction; iron alloys; magnetic force microscopy; metallic glasses; scanning-transmission electron microscopy; silicon alloys; sputtered coatings; tomography; FeBSiC; Lorentz electron microscopy; Lorentz electron tomography; MFM image contrast; STEM; amorphous ferromagnetic alloy coated; coated MFM tips; differential phase contrast; hard disk sample; stray field distributions; Amorphous magnetic materials; Amorphous materials; Astronomy; Electron microscopy; Magnetic force microscopy; Magnetic forces; Magnetization; NIST; Physics; Tomography;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800730

Filename

800730