• DocumentCode
    1260684
  • Title

    Reduction of Lift-Off Effects in Pulsed Eddy Current for Defect Classification

  • Author

    He, Yunze ; Pan, Mengchun ; Luo, Feilu ; Tian, Guiyun

  • Author_Institution
    Coll. of Mechatron. & Autom., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    47
  • Issue
    12
  • fYear
    2011
  • Firstpage
    4753
  • Lastpage
    4760
  • Abstract
    Pulsed eddy-current (PEC) testing is an electromagnetic nondestructive testing & evaluation (NDT&E) technique and defect classification is one of the most important steps in PEC defect characterization. With pulse excitation, the PEC response signals contain more features in time domain and rich information in frequency domain. This paper investigates feature extraction techniques for PEC defect classification including rising time, differential time to peak and differential time to zero, spectrum amplitude, and differential spectrum amplitude. Experimental study has been undertaken on Al-Mn 3003 alloy samples with artificial surface defects, sub-surface defects, and defects in two-layer structures under different lift-off. Experimental results show that methods are effective to classify the defects both in single-layer structures and two-layer structures. Comparing the results of different methods, it is found that differential process can eliminate the lift-off in defect classification in both time domain and frequency domain. The study can be extended to defect classification in complex structures, where lift-off effects are significant.
  • Keywords
    aluminium alloys; eddy current testing; electromagnetism; manganese alloys; surface structure; 3003 alloy; differential spectrum amplitude; electromagnetic nondestructive testing; feature extraction method; frequency domain; lift-off effects; pulsed eddy current testing; single-layer structure; surface defect classification; time domain; two-layer structure; Eddy currents; Feature extraction; Frequency domain analysis; Nondestructive testing; Time domain analysis; Time factors; Defect classification; feature extraction; frequency spectrum analysis; lift-off; pulsed eddy current;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2160726
  • Filename
    5934532