DocumentCode
1261597
Title
Characterizing substrate coupling in deep-submicron designs
Author
Silveira, Luis Miguel ; Vargas, Nuno
Author_Institution
Inst. Superior Tecnico, Tech. Univ. Lisbon, Portugal
Volume
19
Issue
2
fYear
2002
Firstpage
4
Lastpage
15
Abstract
The accurate modeling of noise-coupling effects caused by crosstalk through the substrate is an increasingly important concern for design and verification of analog, digital, and mixed systems. With the technique described here, designers can efficiently extract accurate substrate-coupling parameters from deep-submicron designs
Keywords
crosstalk; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; substrates; analog systems; crosstalk; deep-submicron designs; digital systems; mixed systems; noise-coupling modeling; substrate; verification; Circuit noise; Circuit testing; Coupling circuits; Crosstalk; Data mining; Delay; Fabrication; Finite difference methods; Phase noise; Switching circuits;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.990437
Filename
990437
Link To Document