• DocumentCode
    1261711
  • Title

    Frequency and transient response of yoke flux for 45/55 NiFe and CoTaZr thin film write heads

  • Author

    Jury, Jason ; George, Peter ; Judy, Jack H.

  • Author_Institution
    Center for Micromagnetics & Inf. Technol., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2508
  • Lastpage
    2510
  • Abstract
    This paper describes measurement and modeling of the frequency and transient response of the yoke flux in plated 45/55 NiFe and amorphous CoTaZr thin film write heads. The frequency response of the flux was determined from impedance measurements without any assumptions about the form of magnetic impedance. The transient response was calculated (i) from the frequency domain response using a inverse Fourier transform and (ii) from the frequency and inductance-current measurements using a nonlinear eddy current model. In all cases, the CoTaZr head showed better high-frequency and highspeed response than the 45/55 NiFe head. In addition, at higher DC bias currents (>60 mA) the CoTaZr flux frequency response shows spin dynamic damping; the NiFe head flux response shows only eddy current damping for all measured bias currents,
  • Keywords
    amorphous magnetic materials; cobalt alloys; eddy currents; equivalent circuits; frequency response; iron alloys; magnetic flux; magnetic heads; magnetic thin film devices; nickel alloys; tantalum alloys; transient response; zirconium alloys; 60 mA; CoTaZr; DC bias currents; NiFe; amorphous CoTaZr thin film write heads; eddy current damping; frequency measurements; frequency response; high-speed response; impedance measurements; inductance-current measurements; inverse Fourier transform; magnetic impedance; nonlinear eddy current model; plated 45/55 NiFe thin film write heads; spin dynamic damping; transient response; yoke flux; Amorphous materials; Current measurement; Damping; Eddy currents; Frequency measurement; Frequency response; Impedance measurement; Magnetic heads; Transient response; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800874
  • Filename
    800874