• DocumentCode
    1262626
  • Title

    Magnetic and electric properties of Sn-oxide/M (M=Fe, Ni, Co) multilayers

  • Author

    Matsuyama, K. ; Nishihata, K. ; Komatsu, S. ; Nozaki, Y.

  • Author_Institution
    Dept. of Electron. Device Eng., Kyushu Univ., Fukuoka, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2901
  • Lastpage
    2903
  • Abstract
    Magnetic and electronic properties of novel semiconductive-oxide/ferromagnet multilayers of Sn-oxide and ferromagnetic metals (Fe, Ni, Co), deposited with a multi-target rf magnetron sputtering system, were studied. Among the studied material systems, Co/Sn-oxide sustains well-defined layer structure and ferromagnetic property for the thinnest thickness of 1 nm. A thermionic CPP transport was observed in [Co(2 nm)/Sn-oxide (4 nm)]10, which activation energy was evaluated as 4.4×10-3 erg from the thermal dependence of conductivity. Negative magnetoresistance was observed in two orthogonal directions of in-plane external fields, which confirms spin dependent transport in Sn-oxide thin film. The measured MR change is 0.6% (ΔR=0.8 Ω, Rs=140 Ω) at room temperature
  • Keywords
    cobalt; ferromagnetic materials; iron; magnetoresistance; multilayers; negative resistance; nickel; semiconductor-metal boundaries; sputtered coatings; tin compounds; Co; Fe; Ni; Sn-oxide; SnO; activation energy; electric properties; ferromagnetic metals; in-plane external fields; layer structure; magnetic properties; multi-target RF magnetron sputtering system; negative magnetoresistance; room temperature; semiconductive-oxide/ferromagnet multilayers; spin dependent transport; thermal dependence; thermionic CPP transport; Iron; Magnetic materials; Magnetic multilayers; Magnetic properties; Magnetic semiconductors; Magnetoresistance; Semiconductor materials; Sputtering; Thermal conductivity; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.801019
  • Filename
    801019