DocumentCode
1264737
Title
Near infrared wavemeter in polycrystalline germanium on silicon
Author
Masini, G. ; Colace, L. ; Assanto, G.
Author_Institution
Dept. of Electron. Eng., Terza Univ., Rome, Italy
Volume
35
Issue
18
fYear
1999
fDate
9/2/1999 12:00:00 AM
Firstpage
1549
Lastpage
1551
Abstract
A novel solid-state device for the spectral analysis of near infrared light is presented. The device is an array of six photodetectors in polycrystalline Ge on Si, each element being wavelength selective. The fabrication, characterisation and demonstration of the device both as a wavelength meter and spectrum analyser are presented
Keywords
elemental semiconductors; germanium; infrared detectors; photodetectors; silicon; spectral analysers; wavemeters; Ge-Si; Si; characterisation; fabrication; near IR wavemeter; near infrared wavemeter; photodetector array; polycrystalline Ge on Si; solid-state device; spectral analysis; spectrum analyser; wavelength selective elements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19991011
Filename
802793
Link To Document