DocumentCode
1265971
Title
Evaluation of Radar Backscattering Models IEM, Oh, and Dubois for SAR Data in X-Band Over Bare Soils
Author
Baghdadi, Nicolas ; Saba, Elie ; Aubert, Maelle ; Zribi, Mehrez ; Baup, Frederic
Author_Institution
Unite Mixte de Rech. Territoires, Environ., Teledetection et Inf. Spatiale, Agric. & Environ. Eng. Res. (CEMAGREF), Montpellier, France
Volume
8
Issue
6
fYear
2011
Firstpage
1160
Lastpage
1164
Abstract
The objective of this letter is to evaluate the surface radar backscattering models, namely, integral equation model (IEM), Oh, and Dubois, for synthetic aperture radar data in X-band over bare soils. This analysis uses a large database of TerraSAR-X images and in situ measurements (soil moisture “mv” and surface roughness “ h_rms”). Oh´s model correctly simulates the radar signal for HH and VV polarizations, whereas the simulations performed with the Dubois model show a poor correlation between TerraSAR-X data and model. The backscattering IEM simulates correctly the backscattering coefficient only for h_rms <; 1.5 cm in using an exponential correlation function and for h_rms >; 1.5 cm in using Gaussian function. However, the results are not satisfactory for the use of IEM in the inversion of TerraSAR-X data. A semiempirical calibration of IEM was done in X-band. Good agreement was found between the TerraSAR-X data and the simulations using the calibrated version of the IEM.
Keywords
backscatter; electromagnetic wave polarisation; electromagnetic wave scattering; moisture; remote sensing by radar; soil; synthetic aperture radar; Dubois radar backscattering model; Gaussian function; HH radar polarization; IEM radar backscattering model; Oh radar backscattering model; TerraSAR-X images; VV radar polarization; X-band SAR data; bare soil; integral equation model; radar backscattering model evaluation; semiempirical calibration; soil moisture; surface radar backscattering models; surface roughness; synthetic aperture radar data; Backscatter; Correlation; Data models; Radar; Rough surfaces; Soil; Surface roughness; Dubois model; Oh model; TerraSAR-X images; integral equation model (IEM);
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2011.2158982
Filename
5942144
Link To Document