DocumentCode
1266738
Title
The design, characterization, and modeling of RF LDMOSFETs on silicon-on-insulator material
Author
McShane, E. ; Shenai, Krishna
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume
49
Issue
4
fYear
2002
fDate
4/1/2002 12:00:00 AM
Firstpage
643
Lastpage
651
Abstract
This paper presents the first results of a practical 30 V RF LDMOSFET in silicon-on-insulator (SOI) material. Its complete electrical characteristics, DC and radio frequency (RF), are presented. Bulk silicon LDMOSFETs are popular in RF power applications, and SOI promises to improve device characteristics, enhance integration and provide high-temperature robustness. This work demonstrates that SOI LDMOSFETs can deliver performance comparable to bulk Si using an SOI CMOS foundry with only minimal process enhancements. To investigate the impact of feature sizing in the LDD and gate length on the static and RF performance, 12 devices were fabricated. Characterization was done at the wafer level and devices were packaged and used to construct a class A RF amplifier. The devices exhibited a subthreshold slope of 214 mV/decade, a transconductance of 30 mS, and fT up to 10.9 GHz. The amplifier had a maximum power output of 115 mW, gain of 14 dB, and a drain efficiency of 27% at Pout, max
Keywords
UHF field effect transistors; power MOSFET; semiconductor device breakdown; semiconductor device models; silicon-on-insulator; 1 GHz; 10.9 GHz; 115 mW; 14 dB; 27 percent; 30 V; 30 mS; DC characteristics; LDD; RF LDMOSFETs; RF characteristics; RF power applications; SOI CMOS foundry; SOI material; class-A RF amplifier; electrical characteristics; feature sizing; gate length; high-temperature robustness; lateral double-diffused MOSFET; lightly doped drain; power MOSFETs; subthreshold slope; transconductance; CMOS process; Electric variables; Foundries; Packaging; Radio frequency; Radiofrequency amplifiers; Robustness; Silicon on insulator technology; Transconductance; Wafer scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.992874
Filename
992874
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