• DocumentCode
    1268977
  • Title

    Reduction of nonlinear distortion in directly modulated semiconductor lasers by coherent light injection

  • Author

    Yabre, Gnitaboure ; Le Bihan, J.

  • Author_Institution
    Lab. RESO, Ecole Nat. d´´Ingenieurs de Brest, France
  • Volume
    33
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1132
  • Lastpage
    1140
  • Abstract
    A theoretical investigation of the second- and third-order intermodulation distortions (IMDs) in an injection-locked semiconductor laser under small-signal modulation is presented. The results show that a substantial reduction of the laser nonlinearity can be obtained, depending on both the injection level and frequency detuning between the master and slave lasers. The intensity modulation frequency response is also reported and shows that the injection-locked laser may also have a significantly improved behavior over the same free-running laser, revealed mostly in the reduced resonance peak and the broadening of the modulation bandwidth available
  • Keywords
    electro-optical modulation; frequency response; intermodulation distortion; laser theory; laser tuning; light coherence; optical noise; semiconductor device models; semiconductor lasers; coherent light injection; directly modulated semiconductor lasers; free-running laser; frequency detuning; injection level; injection-locked laser; injection-locked semiconductor laser; intensity modulation frequency response; laser nonlinearity; master lasers; modulation bandwidth broadening; nonlinear distortion reduction; reduced resonance peak; second-order intermodulation distortions; slave lasers; small-signal modulation; theoretical investigation; third-order intermodulation distortions; Bandwidth; Frequency response; Intensity modulation; Intermodulation distortion; Laser noise; Laser theory; Master-slave; Nonlinear distortion; Resonance; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.594875
  • Filename
    594875