• DocumentCode
    1269189
  • Title

    Monte Carlo modeling of coherent scattering: influence of interference

  • Author

    Leliveld, C.J. ; Maas, J.G. ; Bom, V.R. ; van Eijk, C.W.E.

  • Author_Institution
    Philips Med. Syst., Best, Netherlands
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    3315
  • Lastpage
    3321
  • Abstract
    The authors present Monte Carlo (MC) simulation results for the intensity and angular distribution of scattered radiation from cylindrical absorbers. For coherent scattering they have taken into account the effects of interference by using new molecular form factor data for the AAPM plastic materials and water. The form factor data were compiled from X-ray diffraction measurements. The new data have been implemented in the authors´ Electron Gamma Shower (EGS4) Monte Carlo system. The hybrid MC simulation results show a significant influence on the intensity and the angular distribution of coherently scattered photons. It is concluded that MC calculations are significantly in error when interference effects are ignored in the model for coherent scattering. Especially for simulation studies of scattered radiation in collimated geometries, where small angle scattering will prevail, the coherent scatter contribution is highly overestimated when conventional form factor data are used
  • Keywords
    Monte Carlo methods; X-ray diffraction; computerised tomography; modelling; AAPM plastic materials; EGS4 Monte Carlo system; Monte Carlo modeling; X-ray CT; X-ray diffraction measurements; angular distribution; coherent scattering; collimated geometries; cylindrical absorbers; form factor data; intensity; interference effects; medical diagnostic imaging; scattered radiation; small angle scattering; water; Collimators; Electromagnetic scattering; Electrons; Interference; Monte Carlo methods; Particle scattering; Plastics; Solid modeling; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.552743
  • Filename
    552743