• DocumentCode
    1271089
  • Title

    Global Signal Vulnerability (GSV) Analysis for Selective State Element Hardening in Modern Microprocessors

  • Author

    Maniatakos, Michail ; Tirumurti, Chandrasekharan ; Galivanche, Rajesh ; Makris, Yiorgos

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • Volume
    61
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1361
  • Lastpage
    1370
  • Abstract
    Global Signal Vulnerability (GSV) analysis is a novel method for assessing the susceptibility of modern microprocessor state elements to failures in the field of operation. In order to effectively allocate design for reliability resources, GSV analysis takes into account the high degree of architectural masking exhibited in modern microprocessors and ranks state elements accordingly. The novelty of this method lies in the way this ranking is computed. GSV analysis operates either at the Register Transfer (RT-) or at the Gate-Level, offering increased accuracy in contrast to methods which compute the architectural vulnerability of registers through high-level simulations on performance models. Moreover, it does not rely on extensive Statistical Fault Injection (SFI) campaigns and lengthy executions of workloads to completion in RT- or Gate-Level designs, which would make such analysis prohibitive. Instead, it monitors the behavior of key global microprocessor signals in response to a progressive stuck-at fault injection method during partial workload execution. Experimentation with the Scheduler and Reorder Buffer modules of an Alpha-like microprocessor and a modern Intel microprocessor corroborates that GSV analysis generates a near-optimal ranking, yet is several orders of magnitude faster than existing RT- or Gate-Level approaches.
  • Keywords
    hardening; logic gates; microprocessor chips; GSV analysis; Intel microprocessor; SFI campaigns; alpha-like microprocessor; architectural masking; design allocation; gate-level; global signal vulnerability; high-level simulations; key global microprocessor signals; modern microprocessor state elements; modern microprocessors; near-optimal ranking; partial workload execution; register transfer; reliability resources; reorder buffer modules; scheduler modules; selective state element hardening; statistical fault injection; stuck-at fault injection method; Accuracy; Analytical models; Computational modeling; Latches; Microprocessors; Registers; Transient analysis; AVF; GSV; control logic; modern microprocessor; reliability; vulnerability analysis; workload.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2011.172
  • Filename
    6280561