• DocumentCode
    1271521
  • Title

    Proposal for Switching Current Reduction Using Reference Layer With Tilted Magnetic Anisotropy in Magnetic Tunnel Junctions for Spin-Transfer Torque (STT) MRAM

  • Author

    Mojumder, Niladri Narayan ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    59
  • Issue
    11
  • fYear
    2012
  • Firstpage
    3054
  • Lastpage
    3060
  • Abstract
    The design and statistical analysis of a magnetic tunnel junction with pinned-layer uniaxial anisotropy, slightly tilted with respect to the perpendicular magnetic anisotropy (PMA) of the free layer, are presented in the presence of thermally induced magnetic noise. The marginal tilting of the pinned-layer easy axis reduces the critical switching current density by almost 80%, as compared to a regular PMA device for a delay of 2 ns with a switching failure probability lower than 10-9. Substantially lower switching current density in spin-transfer torque MRAM with tilted pinned-layer anisotropy enables the use of a higher resistance-area product with a thicker tunnel barrier that compensates for the tunneling-magnetoresistance rolloff due to the relative misalignment of free- and pinned-layer easy axes.
  • Keywords
    MRAM devices; current density; failure analysis; magnetic tunnelling; probability; PMA device; STT MRAM; critical switching current density; magnetic tunnel junctions; perpendicular magnetic anisotropy; pinned-layer marginal tilting; pinned-layer uniaxial anisotropy; reference layer; resistance-area product; spin-transfer torque MRAM; switching current reduction; switching failure probability; thermally induced magnetic noise; tilted magnetic anisotropy; tilted pinned-layer anisotropy; time 2 ns; tunnel barrier; tunneling-magnetoresistance rolloff; Anisotropic magnetoresistance; Current density; Delay; Magnetic anisotropy; Magnetic tunneling; Switches; Tunneling magnetoresistance; Magnetic anisotropy; magnetic tunnel junction (MTJ); nonvolatile memory; spin-transfer torque (STT); tunneling magnetoresistance (TMR);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2210226
  • Filename
    6280657