DocumentCode
1271521
Title
Proposal for Switching Current Reduction Using Reference Layer With Tilted Magnetic Anisotropy in Magnetic Tunnel Junctions for Spin-Transfer Torque (STT) MRAM
Author
Mojumder, Niladri Narayan ; Roy, Kaushik
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
59
Issue
11
fYear
2012
Firstpage
3054
Lastpage
3060
Abstract
The design and statistical analysis of a magnetic tunnel junction with pinned-layer uniaxial anisotropy, slightly tilted with respect to the perpendicular magnetic anisotropy (PMA) of the free layer, are presented in the presence of thermally induced magnetic noise. The marginal tilting of the pinned-layer easy axis reduces the critical switching current density by almost 80%, as compared to a regular PMA device for a delay of 2 ns with a switching failure probability lower than 10-9. Substantially lower switching current density in spin-transfer torque MRAM with tilted pinned-layer anisotropy enables the use of a higher resistance-area product with a thicker tunnel barrier that compensates for the tunneling-magnetoresistance rolloff due to the relative misalignment of free- and pinned-layer easy axes.
Keywords
MRAM devices; current density; failure analysis; magnetic tunnelling; probability; PMA device; STT MRAM; critical switching current density; magnetic tunnel junctions; perpendicular magnetic anisotropy; pinned-layer marginal tilting; pinned-layer uniaxial anisotropy; reference layer; resistance-area product; spin-transfer torque MRAM; switching current reduction; switching failure probability; thermally induced magnetic noise; tilted magnetic anisotropy; tilted pinned-layer anisotropy; time 2 ns; tunnel barrier; tunneling-magnetoresistance rolloff; Anisotropic magnetoresistance; Current density; Delay; Magnetic anisotropy; Magnetic tunneling; Switches; Tunneling magnetoresistance; Magnetic anisotropy; magnetic tunnel junction (MTJ); nonvolatile memory; spin-transfer torque (STT); tunneling magnetoresistance (TMR);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2210226
Filename
6280657
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