• DocumentCode
    1275374
  • Title

    New Short-Circuit Testing Facilities to Cope With the Recent Development of GIS

  • Author

    Yamamoto, M. ; Yamashita, S. ; Ikeda, H. ; Yanabu, S.

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Issue
    1
  • fYear
    1985
  • Firstpage
    40
  • Lastpage
    41
  • Keywords
    Capacitors; Circuit breakers; Circuit testing; Current supplies; Dielectrics; Geographic Information Systems; Insulation; Power transformer insulation; Sulfur hexafluoride; Surges; Switches; Transient analysis; Valves; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Engineering Review, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1724
  • Type

    jour

  • DOI
    10.1109/MPER.1985.5528561
  • Filename
    5528561
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1275374