• DocumentCode
    1276342
  • Title

    Electromechanical properties of lead zirconate titanate piezoceramics under the influence of mechanical stresses

  • Author

    Zhang, Qiming M. ; Zhao, JianZhong

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    46
  • Issue
    6
  • fYear
    1999
  • Firstpage
    1518
  • Lastpage
    1526
  • Abstract
    In lead zirconate titanate piezoceramics, external stresses can cause substantial changes in the piezoelectric coefficients, dielectric constant, and elastic compliance due to nonlinear effects and stress depoling effects. In both soft and hard PZT piezoceramics, the aging can produce a memory effect that will facilitate the recovery of the poled state in the ceramics from momentary electric or stress depoling. In hard PZT ceramics, the local defect fields built up during the aging process can stabilize the ceramic against external stress depoling that results in a marked increase in the piezoelectric coefficient and electromechanical coupling factor in the ceramic under the stress. Although soft PZT ceramics can be easily stress depoled (losing piezoelectricity), a DC bias electric field, parallel to the original poling direction, can be employed to maintain the ceramic poling state so that the ceramic can be used at high stresses without depoling.
  • Keywords
    ageing; dielectric polarisation; elastic constants; lead compounds; permittivity; piezoceramics; DC bias electric field; PZT; PbZrO3TiO3; aging; dielectric constant; elastic compliance; external mechanical stresses; local defect fields; memory effect; nonlinear effects; piezoceramics; piezoelectric coefficients; poled state; stress depoling effects; Actuators; Aging; Ceramics; Compressive stress; Grain boundaries; Material properties; Mechanical factors; Piezoelectric materials; Titanium compounds; Transducers;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.808876
  • Filename
    808876