DocumentCode
1276355
Title
Modeling Facility Effects on Secondary Electron Emission Experiment
Author
Wang, Joseph ; Wang, Pu ; Belhaj, Mohamed ; Velez, Jean-Charles Mateo
Author_Institution
Dept. of Astronaut. Eng., Univ. of Southern California, Los Angeles, CA, USA
Volume
40
Issue
10
fYear
2012
Firstpage
2773
Lastpage
2780
Abstract
Secondary electron emission is one of the most fundamental problems in spacecraft charging. An accurate prediction of secondary electron yield at low-energy electron impingement has long been a challenging problem due to both the complexity of the process and the difficulty in carrying out accurate measurements in a vacuum chamber. This paper discusses a correlated modeling and experimental study to investigate the facility effects on secondary electron emission yield measurement in a vacuum chamber.
Keywords
secondary electron emission; spacecraft charging; low-energy electron impingement; process complexity; secondary electron emission experiment; spacecraft charging; vacuum chamber; Electric potential; Electron beams; Electron emission; Extraterrestrial measurements; IEEE Potentials; Materials; Mathematical model; Charging; particle in cell (PIC); secondary electron emission;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2012.2211041
Filename
6290418
Link To Document