• DocumentCode
    1277084
  • Title

    Neuromodeling of microwave circuits exploiting space-mapping technology

  • Author

    Bandler, John W. ; Ismail, Mostafa A. ; Rayas-Sánchez, José Ernesto ; Zhang, Qi-Jun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    47
  • Issue
    12
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    2417
  • Lastpage
    2427
  • Abstract
    For the first time, we present modeling of microwave circuits using artificial neural networks (ANN´s) based on space-mapping (SM) technology, SM-based neuromodels decrease the cost of training, improve generalization ability, and reduce the complexity of the ANN topology with respect to the classical neuromodeling approach. Five creative techniques are proposed to generate SM-based neuromodels. A frequency-sensitive neuromapping is applied to overcome the limitations of empirical models developed under quasi-static conditions, Huber optimization is used to train the ANN´s. We contrast SM-based neuromodeling with the classical neuromodeling approach as well as with other state-of-the-art neuromodeling techniques. The SM-based neuromodeling techniques are illustrated by a microstrip bend and a high-temperature superconducting filter
  • Keywords
    circuit CAD; circuit optimisation; generalisation (artificial intelligence); microstrip circuits; microstrip filters; neural nets; superconducting filters; superconducting microwave devices; Huber optimization; empirical models; frequency-sensitive neuromapping; generalization ability; high-temperature superconducting filter; microstrip bend; microwave circuits; neuromodeling; quasi-static conditions; space-mapping technology; Artificial neural networks; Circuit topology; Costs; Frequency; Microstrip filters; Microwave circuits; Microwave technology; Network topology; Samarium; Space technology;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.808989
  • Filename
    808989