Effect of diode characteristics on conducted noise spectrum in CCM boost converter

Author

Ibuchi, Takaaki ; Funaki, Tsuyoshi

Author_Institution

Div. of Electr., Electron. & Inf. Eng., Osaka Univ., Suita, Japan

fYear

2014

fDate

1-4 Sept. 2014

Firstpage

59

Lastpage

64

Abstract

This paper aimed at modeling EMI noise source of the continuous current mode (CCM) DC-DC converter. To this end, this paper focuses on the reverse recovery phenomenon of Si and SiC diodes which is induced in its turn-off operation. This paper also studies the effect of the input voltage level on the recovery current and on the conducted EMI noise in CCM DC-DC boost converter under periodic steady-state operation. The result shows that the terminal capacitance of diodes determines the noise spectrum distribution especially for higher than 30 MHz.

Keywords

DC-DC power convertors; circuit noise; current-mode circuits; electromagnetic interference; semiconductor diodes; silicon; silicon compounds; wide band gap semiconductors; CCM boost converter; EMI noise source; Si; SiC; conducted noise spectrum; continuous current mode DC-DC converter; diode characteristics; reverse recovery phenomenon; turn-off operation; Current measurement; Electromagnetic compatibility; Frequency measurement; Inductors; Noise; Semiconductor diodes; Voltage measurement; PiN diode; boost converter; noise terminal voltage; reverse recovery characteristics; schottky barrier diode;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on

Conference_Location

Gothenburg

Type

conf

DOI

10.1109/EMCEurope.2014.6930877

Filename

6930877