Parametric reconstruction of stochastic EMI sources based on two-point planar near-field scanning

In this paper a 2D stochastic EMI sources identification algorithm based on two-point time-domain scanning of electromagnetic near-field tangential components is presented. The radiating structure is considered as a set of simple electrical dipoles arranged on a grid in object plane. The autocorrelation and cross-correlation spectra are used for the characterization of stochastic field distribution. These characteristics are used to determine the distribution of dipole moments and to estimate the parameters of the real radiation sources. Typical cases of mutual uncorrelated sources and fully correlated sources are discussed as well as the modeling results. The experimental data was processed with proposed parametric identification procedure for a spatial localization of equivalent dipoles and effective sources inside the structure.