• DocumentCode
    1277545
  • Title

    Germanium as a versatile material for low-temperature micromachining

  • Author

    Li, Biao ; Xiong, Bin ; Jiang, Linan ; Zohar, Yitshak ; Wong, Man

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • Volume
    8
  • Issue
    4
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    372
  • Abstract
    Though germanium (Ge) shares many similar physical properties with silicon (Si), it also possesses unique characteristics that are complementary to those of Si. The advantages of Ge include its compatibility with Si microfabrication, its excellent gas and liquid phase etch selectivity to other materials commonly used in Si micromachining, and its low deposition temperature (<350°C) that potentially allows Ge to be used after the completion of a standard CMOS run. Wider applications of Ge as a structural, sacrificial, and sensor material require a more systematic investigation of its processing and properties. The results of such an undertaking are presently reported. The topics covered are the formation of Ge thin films and novel application of the selective deposition of Ge to etch hole filling, characterization of the effects of thermal treatment on the evolution of the residual stress in Ge thin films, etch selectivity for etch mask and sacrificial layer applications, and gas phase release technique for stiction elimination
  • Keywords
    elemental semiconductors; etching; germanium; internal stresses; masks; micromachining; micromechanical devices; Ge; deposition temperature; etch hole filling; etch mask; etch selectivity; gas phase release technique; low-temperature micromachining; residual stress; sacrificial layer; selective deposition; sensor material; thermal treatment; Etching; Filling; Germanium; Micromachining; Sensor phenomena and characterization; Sensor systems and applications; Silicon; Sputtering; Temperature sensors; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.809050
  • Filename
    809050