• DocumentCode
    1280754
  • Title

    On-chip sampling in CMOS integrated circuits

  • Author

    Delmas-Bendhia, S. ; Caignet, F. ; Sicard, E. ; Roca, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Inst. of Appl. Sci., Toulouse, France
  • Volume
    41
  • Issue
    4
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    403
  • Lastpage
    406
  • Abstract
    This paper presents a technique for precise crosstalk delay measurement based on on-chip sampling. Results obtained on a test chip fabricated in 0.7-μm CMOS technology exhibit a 100% delay increase in a long coupled line configuration
  • Keywords
    CMOS integrated circuits; coupled transmission lines; crosstalk; delays; integrated circuit measurement; integrated circuit technology; signal sampling; transients; 0.7 mum; CMOS integrated circuits; CMOS technology; crosstalk delay measurement; delay; long coupled line configuration; low-energy transients; on-chip sampling; test chip; very fast transients; CMOS integrated circuits; CMOS technology; Circuit testing; Coupling circuits; Crosstalk; Delay; Integrated circuit measurements; Integrated circuit technology; Sampling methods; Semiconductor device measurement;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.809837
  • Filename
    809837
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1280754