DocumentCode
128111
Title
A method using an open TEM cell to extract the complex permittivity of an unknown material
Author
Tumayan, R. ; Bunlon, X. ; Reineix, Alain ; Andrieu, Guillaume ; Guiffaut, Christophe
Author_Institution
Renault S.A.S., France
fYear
2014
fDate
1-4 Sept. 2014
Firstpage
1102
Lastpage
1106
Abstract
A simple method for the measurement of complex permittivity is presented using an open TEM (Transverse Electro-Magnetic) cell. The scattering parameters of the TEM cell are measured with and without a rectangular sample of the material under interest in the cross section of the cell. Then the principle is to run a FDTD (Finite Differences Time Domain) simulation of the measurement setup and find the complex permittivity of the sample model which minimizes the error between measurement and simulation thanks to an optimization loop. This method provides the complex permittivity of any non-metallic materials between 1 kHz and 200 MHz. The aim of this work is to make a fast parameter extraction to build a 3D simulation model and predict the shielding effectiveness of a complex geometry made of such a material.
Keywords
S-parameters; TEM cells; composite materials; electromagnetic shielding; finite difference time-domain analysis; optimisation; permittivity measurement; radiofrequency measurement; 3D simulation model; FDTD; complex permittivity; finite differences time domain simulation; frequency 1 kHz to 200 MHz; open TEM cell; open transverse electromagnetic cell; optimization loop; permittivity measurement; scattering parameters; shielding effectiveness; Electromagnetic compatibility; Materials; Optimization; Permittivity; Permittivity measurement; TEM cells; Time-domain analysis; FDTD; TEM cell; automotive; composite material; measurement; optimization; permittivity; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location
Gothenburg
Type
conf
DOI
10.1109/EMCEurope.2014.6931067
Filename
6931067
Link To Document