• DocumentCode
    1284435
  • Title

    Theoretical studies of the effect of strain on the performance of strained quantum well lasers based on GaAs and InP technology

  • Author

    Loehr, John P. ; Singh, Jasprit

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    708
  • Lastpage
    716
  • Abstract
    A discussion is presented of the use of strain to improve the performance of quantum well laser structures. The deformation potential theory is used to study the effect of strain produced by the addition of excess indium on the conduction band and valence band properties. Full-band mixing effects are retained in the calculations. Using a numerical technique developed to study laser parameters in arbitrary quantum well structures, the authors study the effect of strain on the threshold current density and polarization dependence. Dramatic improvements are found due to the strain-induced band-structure changes. Optimization results are presented which show that single quantum well structures have the best performance
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; piezo-optical effects; piezoelectricity; semiconductor junction lasers; semiconductor quantum wells; GaAs; III-V semiconductors; InxGa1-xAs-Al0.3Ga0.7 As; InP; conduction band; deformation potential theory; numerical technique; polarization dependence; quantum well laser structures; single quantum well structures; strain; strain-induced band-structure changes; strained quantum well lasers; threshold current density; valence band properties; Capacitive sensors; Gallium arsenide; Indium phosphide; Laser theory; Lattices; Molecular beam epitaxial growth; Quantum mechanics; Quantum well lasers; Semiconductor lasers; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.81381
  • Filename
    81381