DocumentCode
1284511
Title
Cross-Entropy Method for the Optimization of Optical Alignment Signals With Diffractive Effects
Author
Chen, Jung-Chieh ; Wang, Sen-Hung ; Lee, Ming-Kai ; Li, Chih-Peng
Author_Institution
Dept. of Optoelectron. & Commun. Eng., Nat. Kaohsiung Normal Univ., Kaohsiung, Taiwan
Volume
29
Issue
18
fYear
2011
Firstpage
2706
Lastpage
2714
Abstract
We present a cross-entropy (CE)-based method to design 2-D zero reference codes (ZRCs) with minimum diffractive effects. Without diffraction effects, the optimum ZRC design problem is known as autocorrelation approximation. However, in high-resolution grating systems, limitations are given by the diffraction in the design of ZRCs. If the diffraction is considered, the output signal registered in the photodiode will widen and degrade, invalidating the autocorrelation approximation for the 2-D ZRC design. To minimize the diffractive effects in the design of 2-D ZRC, this paper first formulates the 2-D ZRC design problem with diffractive effects as a particular combinatorial optimization problem. Next, it proposes the application of the CE method to solve the problem. Compared with the conventional genetic algorithm (GA)-assisted 2-D ZRC design method, the simulation results show that the proposed CE method obtains better 2-D ZRCs that are less sensitive to diffractive effects. About 11.43 times less searching is required for the proposed CE method than for the GA. This indicates that the proposed CE method can obtain good ZRCs with minimum diffractive effects while maintaining low complexity.
Keywords
entropy; genetic algorithms; optical design techniques; optical information processing; photodiodes; 2D zero reference code; autocorrelation approximation; combinatorial optimization problem; cross-entropy method; genetic algorithm assisted 2-D ZRC design; high-resolution grating systems; light diffraction; optical alignment signals; optical design; photodiode; signal registration; Algorithm design and analysis; Approximation methods; Correlation; Design methodology; Gratings; Pixel; Robustness; Cross-entropy (CE) method; diffractive effect; grating system; zero reference codes (ZRCs);
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2011.2163182
Filename
5963700
Link To Document