• DocumentCode
    1287944
  • Title

    Bulk-compensated technique and its application to subthreshold ICs

  • Author

    Luo, Haipeng ; Han, Yi ; Cheung, Ray C. C. ; Han, Xiaoyu ; Zhu, Dalong

  • Author_Institution
    Dept. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    46
  • Issue
    16
  • fYear
    2010
  • Firstpage
    1105
  • Lastpage
    1106
  • Abstract
    A bulk-compensated technique to reduce process-related sensitivity in subthreshold integrated circuits (ICs) is presented. The bulk-compensated technique builds up a ´detecting-feedback´ loop, and achieves effective compensation for the process-related fluctuation of MOS transistors through bulk potential modulation, which greatly enhances the stability and robustness of subthreshold ICs. A bulk-compensated class-C inverter is implemented in 0.13 μm CMOS mixed-signal process. Compared to traditional class-C inverters, the sensitivity of the proposed inverter to process variation is greatly reduced.
  • Keywords
    CMOS integrated circuits; MOSFET; invertors; mixed analogue-digital integrated circuits; sensitivity analysis; CMOS mixed-signal process; MOS transistors; bulk potential modulation; bulk-compensated class-C inverter technique; feedback loop detection; process-related sensitivity reduction; size 0.13 mum; subthreshold IC; subthreshold integrated circuit;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.0559
  • Filename
    5542554