• DocumentCode
    128849
  • Title

    Emulation-based robustness assessment for automotive smart-power ICs

  • Author

    Harrant, Manuel ; Nirmaier, Thomas ; Kirscher, Jerome ; Grimm, Christoph ; Pelz, Georg

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper we present a concept for assessing the robustness of automotive smart power ICs through lab measurements with respect to application variance and parameter spread. Classical compliance to the product specification, where only minimum and maximum values are defined, is not enough to assess device robustness since complex transients of application components cannot be defined within single specification parameters. That is why application fitness becomes a necessary task to reduce device failures, which may occur in the application. One solution would be to enhance traditional lab verification methods with a concept that considers application and parameter spread. This innovative concept is demonstrated on an electronic throttle control application. It has been emulated in real-time, including power amplification and application-relevant parameters. Monte Carlo experiments were carried out within the application space to evaluate the influence of parameter spread on selected system characteristics. Finally, an appropriate metric was used to quantify the robustness of the micro-electronic device within its application.
  • Keywords
    automotive electronics; integrated circuit reliability; integrated circuit testing; power integrated circuits; Monte Carlo experiments; application relevant parameter; automotive smart power IC; device failure; device robustness; electronic throttle control application; emulation based robustness assessment; parameter spread; power amplification; DC motors; Emulation; Gears; Mathematical model; Robustness; Torque; Valves; Application Fitness; Automotive Power Micro-electronics; Electronic Throttle Control; Post-Silicon Verification; Worst-Case Distance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.017
  • Filename
    6800218