• DocumentCode
    128858
  • Title

    Spatial distribution of state densities dominating strain sensitivity of carbon nanotubes

  • Author

    Ohnishi, Masato ; Suzuki, Kenji ; Miura, Hidekazu

  • Author_Institution
    Dept. of Nanomech., Tohoku Univ., Sendai, Japan
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    In any electronic devices and sensors, internal strain is induced because of the thermal change or the lattice mismatch between different materials. It is, therefore, expected that when carbon nanotubes (CNTs) are used for electronic devices, their electronic properties are changed caused by the deformation. In this study, we study the mechanism of the change in the band gap of CNTs under the radial strain in terms of state density distribution. We found that the spatial distribution of the state density dominates its strain sensitivity, and thus, the strain sensitivity of electronic properties of CNTs. We also calculated the change in the current through the deformed CNTs. The founding indicates that the state density analysis should be useful for the development of novel electronic devices and nano electro mechanical systems and for assuring their reliable performance.
  • Keywords
    carbon nanotubes; deformation; electronic density of states; energy gap; C; band gap; carbon nanotubes; deformation; electronic devices; electronic properties; internal strain; lattice mismatch; nanoelectromechanical systems; radial strain; sensors; spatial distribution; state density distribution; strain sensitivity; thermal change; Carbon nanotubes; Distribution functions; Electrodes; Graphical models; Photonic band gap; Sensitivity; Strain; carbon nanotube; electronic state; state density; strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
  • Conference_Location
    Yokohama
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4799-5287-8
  • Type

    conf

  • DOI
    10.1109/SISPAD.2014.6931589
  • Filename
    6931589