DocumentCode
1288676
Title
Evanescent microwaves: a novel super-resolution noncontact nondestructive imaging technique for biological applications
Author
Tabib-Azar, M. ; Katz, J.L. ; LeClair, S.R.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
Volume
48
Issue
6
fYear
1999
fDate
12/1/1999 12:00:00 AM
Firstpage
1111
Lastpage
1116
Abstract
Scanning tunneling microscopes (STM) and atomic force microscopes (AFM) are used to study biological materials. These methods, often capable of achieving atomic resolutions, reveal fascinating information regarding the inner workings of these materials. However, both STM and AFM require physical contact to the specimen. In the case of STM the specimen needs to be conducting as well. Here we introduce a new method for imaging biological materials through air or a suitable liquid using decaying or evanescent fields at the tip of a properly designed microwave resonator. This novel method involves the use of an evanescent microwave probe (EMP) and it is capable of imaging a variety of nonuniformities in biological materials including conductivity, permittivity, and density variations. EMP is a noncontact and nondestructive sensor and it does not require conducting specimens. Its spatial resolution is currently around 0.4 μm at 1 GHz. We have used this probe to map nonuniformities in a variety of materials including metals, semiconductors, insulators, and biological and botanical samples. Here we discuss applications of EMP imaging in bone, teeth, botanical, and agricultural specimens
Keywords
biomedical imaging; microwave imaging; 0.4 micron; 1 GHz; biological material; conductivity; density; evanescent microwave probe; microwave resonator; permittivity; super-resolution near-field noncontact nondestructive imaging; Atomic force microscopy; Biological materials; Conducting materials; Conductivity; EMP radiation effects; Microwave imaging; Microwave theory and techniques; Probes; Spatial resolution; Tunneling;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.816123
Filename
816123
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