Dispersive comb-spectrum interferometer: metrological characterization

Author

Minoni, Umberto ; Rovati, Luigi ; Bonardi, M. ; Docchio, Franco

Author_Institution

Dept. of Electron. for Autom., Brescia Univ., Italy

Volume

48

Issue

6

fYear

1999

fDate

12/1/1999 12:00:00 AM

Firstpage

1197

Lastpage

1200

Abstract

The paper reports results of an investigation on the main measurement uncertainty sources in a novel distance meter based on dispersive comb-spectrum interferometry. The light source is a commercial laser diode operating at 670 nm driven under the threshold condition, and emitting a beam with a comb-shaped spectrum. Sensitivity of the measurement to the operating conditions has been evaluated. Results from an experimental activity aimed at characterizing the laser and to measure the performance of a prototype implementation are also presented. The system can perform unambiguous nonincremental distance measurements over a range of 0.8 mm with a total uncertainty of about 1.5 μm

Keywords

distance measurement; light interferometers; measurement by laser beam; measurement uncertainty; optical dispersion; 0.8 mm; 670 nm; dispersive comb-spectrum interferometer; distance meter; laser diode light source; measurement uncertainty sources; metrological characterization; nonincremental distance measurements; operating conditions; threshold condition; Charge-coupled image sensors; Diode lasers; Dispersion; Distance measurement; Frequency measurement; Laser beams; Measurement uncertainty; Optical beam splitting; Optical interferometry; Performance evaluation;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.816136

Filename

816136