Extended Probe Instrument Calibration (EPIC) for Accurate Spherical Near-Field Antenna Measurements

Author

Pogorzelski, Ronald J.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

57

Issue

10

fYear

2009

Firstpage

3366

Lastpage

3375

Abstract

A probe calibration technique is described that removes artifacts from spherical near-field antenna measurements. The technique is based on preliminary calibration measurements of a known antenna, a process that characterizes the probe and any stationary objects in the measurement chamber including the walls in terms of a set of correction coefficients. These coefficients are then used in a correction algorithm that recovers the correct antenna pattern from the corrupted measurement data.

Keywords

anechoic chambers (electromagnetic); antenna radiation patterns; anechoic chambers; antenna pattern; correction coefficients; extended probe instrument calibration; near-field antenna measurements; Antenna measurements; Aperture antennas; Apertures; Calibration; Electric variables measurement; Electromagnetic measurements; Instruments; Noise measurement; Performance evaluation; Probes; Propulsion; Scattering; Testing; Anechoic chambers (electromagnetic); antenna measurements; near-field far-field transformation;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/TAP.2009.2029392

Filename

5196766