• DocumentCode
    128899
  • Title

    Electro-thermal simulation of silicon carbide power modules

  • Author

    Akturk, A. ; Goldsman, N. ; Potbhare, S.

  • Author_Institution
    CoolCAD Electron. LLC, College Park, MD, USA
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    237
  • Lastpage
    240
  • Abstract
    We report on our development of a Silicon Carbide Power System Computer Aided Design Tool to address the need for improved methodologies for developing next generation high efficiency power electronics using Silicon Carbide power devices. The first major achievement is to develop compact models for SiC power MOSFETs and to input these models into CoolCAD´s SPICE-type simulator, CoolSPICE (the student version that is for simulating standard SPICE circuits is available online: http://coolcadelectronics.com/coolspice/), to facilitate SiC power circuits design. A second aspect of the work is to extract thermal models for SiC MOSFETs, dies, packages, printed circuit boards, and modules, and then input these thermal models into a thermal simulator for calculating temperature of electronic devices, circuits and modules.
  • Keywords
    SPICE; modules; power MOSFET; power system CAD; printed circuit design; semiconductor device models; semiconductor device packaging; silicon compounds; technology CAD (electronics); thermal engineering; wide band gap semiconductors; CoolCAD SPICE-type simulator; CoolSPICE; SiC; electronic device; electrothermal simulation; packaging; power MOSFET; power circuit design; power device; power electronics; power module; power system computer aided design tool; printed circuit board; thermal model extraction; Biological system modeling; Computational modeling; Integrated circuit modeling; MOSFET; SPICE; Silicon carbide; Solid modeling; SPICE for power devices; Silicon carbide; power electronics; thermal management; thermal simulations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
  • Conference_Location
    Yokohama
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4799-5287-8
  • Type

    conf

  • DOI
    10.1109/SISPAD.2014.6931607
  • Filename
    6931607