• DocumentCode
    128927
  • Title

    Cost-effective decap selection for beyond die power integrity

  • Author

    Yi-En Chen ; Tu-Hsiung Tsai ; Shi-Hao Chen ; Hung-Ming Chen

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In designing reliable power distribution networks (PDN) for power integrity (PI), it is essential to stabilize voltage supply to devices on chip. We usually employ decoupling capacitor (decap) to suppress the noise generated by the switching of devices. There have been numerous prior works on how to select/insert decaps in chip, package, or board to maintain PI, however optimal decap selection is usually not applicable due to design budget and manufacturability. Moreover, design cost is seldom touched or mentioned. In this research, we propose an efficient methodology “PDC-PSO” to automatically optimizing the selection of available decaps. This algorithm not only takes advantage of particle swarm optimization (PSO) to stochastically search the design space, but takes the most effective range of decaps into consideration to outperform the basic PSO. We apply this to three real package designs and the results show that, compared to the original decap selection by rules of thumb, our approach could shorten the design period and we have better combination of decaps at the same or lower cost. In addition, our methodology can also consider package-board co-design in optimizing different operation frequencies.
  • Keywords
    capacitors; electron device noise; integrated circuit interconnections; particle swarm optimisation; semiconductor device packaging; PDC-PSO; PDN; PI; decoupling capacitor; design budget; design cost; design space; device switching; die power integrity; manufacturability; optimal decap selection; package-board codesign; particle swarm optimization; power distribution networks; preferred decap choice; real package designs; voltage supply; Algorithm design and analysis; Capacitors; Frequency-domain analysis; Impedance; Noise; Optimization; Particle swarm optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.059
  • Filename
    6800260