• DocumentCode
    128935
  • Title

    Interplay among Bilayer pseudoSpin field-effect transistor (BiSFET) performance, BiSFET scaling and condensate strength

  • Author

    Xuehao Mou ; Register, Leonard F. ; Banerjee, Sanjay K.

  • Author_Institution
    Dept. of ECE, Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    309
  • Lastpage
    312
  • Abstract
    It has been proposed that superfluid excitonic condensates may be possible in dielectrically separated graphene layers or other two-dimensional materials. This possibility was the basis for the proposed ultra-low power Bilayer pseudoSpin Field-effect Transistor (BiSFET). Previously, we developed an atomistic tight-binding quantum transport simulator, including the non-local exchange interaction, and used it to demonstrate the essential excitonic superfluid transport physics which underlies the proposed BiSFET in presence of such a condensate. Here we report on extension of that work to analyze dependencies on device scaling and the condensate strength of BiSFET performance and required device parameters including interlayer conductance, and critical current and voltage.
  • Keywords
    electric admittance; excitons; field effect transistors; low-power electronics; BiSFET; atomistic tight-binding quantum transport simulator; condensate strength; device parameters; device scaling; dielectrically separated graphene layers; excitonic superfluid transport physics; nonlocal exchange interaction; superfluid excitonic condensates; two-dimensional materials; ultra-low power bilayer pseudospin field-effect transistor; Couplings; Critical current density (superconductivity); Elementary particle exchange interactions; Excitons; Graphene; Registers; Transistors; BiSFET; Fock exchange; critical current and voltage; exciton condensate; graphene; quantum transport;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
  • Conference_Location
    Yokohama
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4799-5287-8
  • Type

    conf

  • DOI
    10.1109/SISPAD.2014.6931625
  • Filename
    6931625