• DocumentCode
    128940
  • Title

    Single dopant nanowire transistors: Influence of phonon scattering and temperature

  • Author

    Carrillo-Nunez, Hamilton ; Bescond, M. ; Dib, E. ; Cavassilas, N. ; Lannoo, M.

  • Author_Institution
    IM2NP, Bat. IRPHE, Marseille, France
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    321
  • Lastpage
    324
  • Abstract
    A three-dimensional self-consistent non-equilibrium Green´s function approach is used to investigate the influence of phonon scattering in single dopant nanowire transistors. Phonon interactions are described within the self-consistent Born approximation in which both acoustic and optical phonons are included. Transport properties are then analyzed in the ballistic and scattering regimes. Ballistic results first confirm the current hysteresis due to two different screening mechanisms of the dopant reported by Mil´nikov et-al [1]. The transition between them is smoothed by the interactions with acoustic phonons which suppress the current hysteresis. Interestingly our findings also show a beneficial impact of the optical phonon interactions. They generate a phonon-assisted resonant tunneling from which can result a higher current than in the ballistic regime. Finally a temperature dependance analysis shows that the hysteresis should be restored at lower temperatures.
  • Keywords
    Green´s function methods; MOSFET; nanowires; resonant tunnelling; acoustic phonons; ballistic results; current hysteresis; optical phonons; phonon interactions; phonon scattering; phonon-assisted resonant tunneling; screening mechanisms; self-consistent Born approximation; single dopant nanowire transistors; temperature dependance analysis; three-dimensional self-consistent nonequilibrium Green´s function approach; transport properties; Acoustics; Hysteresis; Optical bistability; Optical scattering; Phonons; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
  • Conference_Location
    Yokohama
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4799-5287-8
  • Type

    conf

  • DOI
    10.1109/SISPAD.2014.6931628
  • Filename
    6931628