Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits

Author

Ting Zhu ; Steer, Michael B. ; Franzon, Paul D.

Author_Institution

Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA

Volume

29

Issue

6

fYear

2012

Firstpage

74

Lastpage

83

Abstract

Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.

Keywords

analogue integrated circuits; calibration; circuit optimisation; low noise amplifiers; phase locked loops; radiofrequency integrated circuits; analog RF circuits; design flow; design optimisation; knob settings; performance parameters; process variations; surrogate model based self-calibrated design; temperature compensation; yield loss; Adaptation models; Calibration; Integrated circuit modeling; Integrated circuits; Mathematical model; Noise measurement; Radio frequency; Voltage control; RF; analog; design aids; integrated circuit; optimization; process-voltage-temperature variation; self-calibration; surrogate modeling; yield;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2012.2220332

Filename

6311428