• DocumentCode
    1291124
  • Title

    Analysis of a fractured 500 kV composite insulator - identification of aging mechanisms and their causes

  • Author

    Lutz, B. ; Cheng, L. ; Guan, Z. ; Wang, L. ; Zhang, F.

  • Author_Institution
    Lab. of Adv. Technol. of Electr. Eng. & Energy, Tsinghua Univ., Shenzhen, China
  • Volume
    19
  • Issue
    5
  • fYear
    2012
  • fDate
    10/1/2012 12:00:00 AM
  • Firstpage
    1723
  • Lastpage
    1731
  • Abstract
    In this paper, a fractured 500 kV ac composite insulator, whose fracture characteristics differ significantly from those of brittle fracture, is analyzed in order to identify the aging mechanisms involved and their causes. Several sheath punctures occurred along the insulator which apparently originated from inside the insulator. Removal of the sheath revealed weak adhesion as well as tracking along the sheath-core interface. Weak microscopic as well as macroscopic interfaces were indicated by the insulator´s weak performance in the water diffusion and dye penetration test according to IEC 62217. The core material was analyzed by means of FTIR identifying glass corrosion, ion exchange and hydrolysis as major degradation mechanisms. Based on the results of analysis, a water induced aging process is proposed and recommendations for online monitoring of composite insulators with respect to interfacial aging are given.
  • Keywords
    IEC standards; adhesion; ageing; brittle fracture; composite insulators; corrosion; dyes; glass; ion exchange; AC composite insulator; FTIR; IEC 62217; aging mechanism identification; brittle fracture characteristic; core material analysis; dye penetration; glass corrosion identification; hydrolysis; ion exchange; macroscopic interface; online monitoring; sheath puncture; sheath removal; sheath-core interface; voltage 500 kV; water diffusion; water induced aging process; weak adhesion; weak microscopic; Aging; Degradation; Glass; Insulators; Surface contamination; Surface cracks; EHV insulators; aging mechanisms; composite insulation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2012.6311521
  • Filename
    6311521