DocumentCode
1291124
Title
Analysis of a fractured 500 kV composite insulator - identification of aging mechanisms and their causes
Author
Lutz, B. ; Cheng, L. ; Guan, Z. ; Wang, L. ; Zhang, F.
Author_Institution
Lab. of Adv. Technol. of Electr. Eng. & Energy, Tsinghua Univ., Shenzhen, China
Volume
19
Issue
5
fYear
2012
fDate
10/1/2012 12:00:00 AM
Firstpage
1723
Lastpage
1731
Abstract
In this paper, a fractured 500 kV ac composite insulator, whose fracture characteristics differ significantly from those of brittle fracture, is analyzed in order to identify the aging mechanisms involved and their causes. Several sheath punctures occurred along the insulator which apparently originated from inside the insulator. Removal of the sheath revealed weak adhesion as well as tracking along the sheath-core interface. Weak microscopic as well as macroscopic interfaces were indicated by the insulator´s weak performance in the water diffusion and dye penetration test according to IEC 62217. The core material was analyzed by means of FTIR identifying glass corrosion, ion exchange and hydrolysis as major degradation mechanisms. Based on the results of analysis, a water induced aging process is proposed and recommendations for online monitoring of composite insulators with respect to interfacial aging are given.
Keywords
IEC standards; adhesion; ageing; brittle fracture; composite insulators; corrosion; dyes; glass; ion exchange; AC composite insulator; FTIR; IEC 62217; aging mechanism identification; brittle fracture characteristic; core material analysis; dye penetration; glass corrosion identification; hydrolysis; ion exchange; macroscopic interface; online monitoring; sheath puncture; sheath removal; sheath-core interface; voltage 500 kV; water diffusion; water induced aging process; weak adhesion; weak microscopic; Aging; Degradation; Glass; Insulators; Surface contamination; Surface cracks; EHV insulators; aging mechanisms; composite insulation;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2012.6311521
Filename
6311521
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