• DocumentCode
    1292616
  • Title

    Experimental and theoretical study of parasitic leakage/resonance in a K/Ka-band MMIC package

  • Author

    Yook, Jong-Gwan ; Katehi, Linda P B ; Simons, Rainee N. ; Shalkhauser, Kurt A.

  • Author_Institution
    Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    44
  • Issue
    12
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2403
  • Lastpage
    2410
  • Abstract
    In this paper, electromagnetic (EM) leakage and spurious resonances in a K/Ka-Band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with the measured data. Both the measured and calculated data indicate several spurious resonances in the 18-24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM. Moreover, the effect of dc bias lines, bond wires, shielding, and the asymmetry of the package on electrical performance are closely examined. In addition, the effect of adding a resistive coating to the inside surface of the package lid and also the use of dielectric packaging materials with very high loss tangent are studied in view of the suppression of the spurious resonances. Finally, design guidelines for the improved package are presented
  • Keywords
    MMIC phase shifters; electromagnetic shielding; finite element analysis; integrated circuit packaging; magnetic leakage; seals (stoppers); 18 to 40 GHz; EM leakage; K-band; Ka-band; MMIC package; asymmetry; bond wires; dc bias lines; finite element method; hermetic package; loss tangent; package lid; parasitic leakage/resonance; phase shifter chip; resistive coating; shielding; spurious resonances; Dielectric losses; Electromagnetic measurements; Finite element methods; MMICs; Numerical simulation; Packaging; Phase measurement; Phase shifters; Resonance; Semiconductor device measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.554569
  • Filename
    554569