• DocumentCode
    1292774
  • Title

    Memory testing. characterisation timing and patterns

  • Author

    Rosenfield, P.

  • Author_Institution
    Teradyne Inc., Chatsworth, USA
  • Volume
    25
  • Issue
    1
  • fYear
    1979
  • fDate
    1/1/1979 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    Semiconductor memory testing is of growing importance to manufacturers of electronic equipment. Memories are being designed into a surprising number of different types of electronic equipment, and so the memory content of end products continues to expand. Also memory complexity, and the complexity of the printed-circuit boards to which they are attached, is increasing. All these factors emphasise the need for memory testing
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1979.0034
  • Filename
    5198047