DocumentCode
129299
Title
Advancing CMOS with carbon electronics
Author
Kreupl, Franz
Author_Institution
Dept. of Hybrid Electron. Syst., Tech. Univ. Muenchen (TUM), Munich, Germany
fYear
2014
fDate
24-28 March 2014
Firstpage
1
Lastpage
6
Abstract
A fresh look on carbon-based transistor channel materials like single-walled carbon nanotubes (CNT) and graphene nanoribbons (GNR) in future electronic applications is given. Although theoretical predictions initially promised that GNR (which do have a bandgap) would perform equally well as transistors based on CNTs, experimental evidence for the well-behaved transistor action is missing up to now. Possible reasons for the shortcomings as well as possible solutions to overcome the performance gap will be addressed. In contrast to GNR, short channel CNT field effect transistors (FET) demonstrate in the experimental realization almost ideal transistor characteristics down to very low bias voltages. Therefore, CNT-FETs are clear frontrunners in the search of a future CMOS switch, that will enable further voltage and gate length scaling. Essential features which distinguish CNT-FETs from alternative solution will be discussed and benchmarked. Finally, the gap to industrial wafer-level scale SWCNT integration will be addressed and strategies for achieving highly aligned carbon nanotube fabrics will be discussed. Without such a high yield wafer-scale integration, SWCNT circuits will be an illusional dream.
Keywords
CMOS integrated circuits; carbon nanotube field effect transistors; nanoribbons; C; CMOS switch; CNT field effect transistors; CNT-FET; GNR; carbon electronics; carbon nanotube fabrics; carbon-based transistor channel materials; gate length scaling; graphene nanoribbons; industrial wafer-level scale SWCNT integration; single-walled carbon nanotubes; voltage length scaling; CNTFETs; Graphene; Inverters; Logic gates; Silicon; carbon nanotube; electronic; graphene; integration; nanoribbon; transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location
Dresden
Type
conf
DOI
10.7873/DATE.2014.250
Filename
6800451
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