DocumentCode
129464
Title
Functional test generation guided by steady-state probabilities of abstract design
Author
Jian Wang ; Huawei Li ; Tao Lv ; Tiancheng Wang ; Xiaowei Li
Author_Institution
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear
2014
fDate
24-28 March 2014
Firstpage
1
Lastpage
4
Abstract
This paper presents a novel method for functional test generation aiming at exploring control state space of the design. The steady-state probabilities (SP´s) of the abstract design´s control FSM are used to guide test generation. The SP´s of the states can reflect how hard the states can be reached, and the hard-to-reach states are assigned with high priority to be exercised. Experimental results show that our method has better performance in test generation in comparison with constrained random simulation, and demonstrate that SP´s provide good guidance on traversing hard-to-reach states of the design under validation.
Keywords
digital simulation; finite state machines; formal verification; probability; program testing; abstract design; constrained random simulation; control FSM; functional test generation; hard-to-reach design states; state space; steady-state probabilities; Abstracts; Aerospace electronics; Concrete; Latches; Space exploration; Steady-state; Vectors; control state space exploration; functional test generation; steady-state probability;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location
Dresden
Type
conf
DOI
10.7873/DATE.2014.334
Filename
6800535
Link To Document