• DocumentCode
    129521
  • Title

    Physical vulnerabilities of Physically Unclonable Functions

  • Author

    Helfmeier, Clemens ; Boit, Christian ; Nedospasov, Dmitry ; Tajik, Shahin ; Seifert, Jean-Pierre

  • Author_Institution
    Dept. of High-Freq. & Semicond. Syst. Tech., Tech. Univ. Berlin, Berlin, Germany
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In recent years one of the most popular areas of research in hardware security has been Physically Unclonable Functions (PUF). PUFs provide primitives for implementing tamper detection, encryption and device fingerprinting. One particularly common application is replacing Non-volatile Memory (NVM) as key storage in embedded devices like smart cards and secure microcontrollers. Though a wide array of PUF have been demonstrated in the academic literature, vendors have only begun to roll out PUFs in their end-user products. Moreover, the improvement to overall system security provided by PUFs is still the subject of much debate. This work reviews the state of the art of PUFs in general, and as a replacement for key storage in particular. We review also techniques and methodologies which make the physical response characterization and physical/digital cloning of PUFs possible.
  • Keywords
    SRAM chips; NVM; PUF; device fingerprinting; digital cloning; encryption; nonvolatile memory; physical cloning; physical response characterization; physical vulnerabilities; physically unclonable functions; secure microcontrollers; smart cards; tamper detection; Encryption; Hardware; Integrated circuits; Inverters; SRAM cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.363
  • Filename
    6800564