• DocumentCode
    1297689
  • Title

    Enhanced Implementations of Hamming Codes to Protect FIR Filters

  • Author

    Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    2112
  • Lastpage
    2118
  • Abstract
    Soft errors, especially those produced in harsh environments (as for example radiation), are a major concern for digital circuits. As technology shrinks, the failure probability of systems working in these environments is steadily growing. In order to tackle this issue, several design techniques are being used, which consider reliability as a key design parameter. Those based on redundancy, as Triple Modular Redundancy (TMR) and Hamming Codes, are especially popular, since they are quite straightforward to implement. However, this usually comes at a high cost, which many times is unfeasible for certain kinds of applications. Therefore, it is convenient to understand the structure and functionality of circuits in order take advantage of their inherent protection capabilities and therefore, minimize the extra redundancy. In this paper, this approach is used in order to optimize the protection of finite impulse response filters using Hamming codes.
  • Keywords
    FIR filters; Hamming codes; redundancy; FIR filter protection; Hamming codes; circuit functionality; digital circuits; finite impulse response filters; system failure probability; triple modular redundancy; Application specific integrated circuits; Clocks; Decoding; Digital circuits; Digital filters; Field programmable gate arrays; Finite impulse response filter; IIR filters; Integrated circuit technology; Protection; Redundancy; Silicon; Single event upset; Space missions; Tunneling magnetoresistance; Digital filters; Single Event Upset (SEU); hamming codes; reliability;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2051162
  • Filename
    5550429