DocumentCode
1297689
Title
Enhanced Implementations of Hamming Codes to Protect FIR Filters
Author
Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio
Author_Institution
Univ. Antonio de Nebrija, Madrid, Spain
Volume
57
Issue
4
fYear
2010
Firstpage
2112
Lastpage
2118
Abstract
Soft errors, especially those produced in harsh environments (as for example radiation), are a major concern for digital circuits. As technology shrinks, the failure probability of systems working in these environments is steadily growing. In order to tackle this issue, several design techniques are being used, which consider reliability as a key design parameter. Those based on redundancy, as Triple Modular Redundancy (TMR) and Hamming Codes, are especially popular, since they are quite straightforward to implement. However, this usually comes at a high cost, which many times is unfeasible for certain kinds of applications. Therefore, it is convenient to understand the structure and functionality of circuits in order take advantage of their inherent protection capabilities and therefore, minimize the extra redundancy. In this paper, this approach is used in order to optimize the protection of finite impulse response filters using Hamming codes.
Keywords
FIR filters; Hamming codes; redundancy; FIR filter protection; Hamming codes; circuit functionality; digital circuits; finite impulse response filters; system failure probability; triple modular redundancy; Application specific integrated circuits; Clocks; Decoding; Digital circuits; Digital filters; Field programmable gate arrays; Finite impulse response filter; IIR filters; Integrated circuit technology; Protection; Redundancy; Silicon; Single event upset; Space missions; Tunneling magnetoresistance; Digital filters; Single Event Upset (SEU); hamming codes; reliability;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2010.2051162
Filename
5550429
Link To Document