• DocumentCode
    1298160
  • Title

    Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

  • Author

    Berg, Melanie D. ; Buchner, Stephen P. ; Kim, Hak ; Friendlich, Mark ; Perez, Christopher ; Phan, Anthony M. ; Seidleck, Christina M. ; LaBel, Kenneth A. ; Kruckmeyer, Kirby

  • Author_Institution
    MEI Technol., Inc., Greenbelt, MD, USA
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    1958
  • Lastpage
    1965
  • Abstract
    A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.
  • Keywords
    analogue-digital conversion; semiconductor device testing; analog-to-digital device testing; device clock loss; dynamic SEE ADC testing; error signature; signal composition; Clocks; Field programmable gate arrays; Instruments; NASA; Noise; Observability; Radiation effects; Single event upset; Synchronization; Testing; Vehicle dynamics; Vehicles; ADC; FPGA; SEE; dynamic;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2052068
  • Filename
    5550499
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1298160