• DocumentCode
    1298873
  • Title

    Space- and surface-charge analysis of plasma-preprocessed PTFE thin films

  • Author

    Takashima, Kazunori ; Oda, Tetsuji

  • Author_Institution
    Dept. of Electr. Eng., Tokyo Univ., Japan
  • Volume
    36
  • Issue
    1
  • fYear
    2000
  • Firstpage
    76
  • Lastpage
    81
  • Abstract
    The space- and surface-charge behavior of corona-charged polytetrafluoroethylene thin films after plasma processing were studied experimentally by space-charge density distribution measurement and thermally stimulated discharge current (TSDC) measurement. The effect of the antistatic process using low-pressure discharge plasma and charge elimination process dipping in tap water was examined. The surface composition of the samples which were plasma- processed was analyzed with X-ray photoelectron spectroscopy (XPS) to study the mechanisms of antistatic process. It was found that charge elimination of plasma-processed samples was enhanced, independently of the kind of processing gas during the plasma processing. Oxygen and nitrogen atoms were observed from the XPS measurement of plasma-processed samples. In particular, a large amount of nitrogen atoms was found on the surface of the samples plasma processed in pure nitrogen gas. The samples plasma processed in pure nitrogen gas showed a large hetero TSDC peak at room temperature before the charge-elimination process. This might be due to nitrogen atoms on the sample surface that were generated during plasma processing
  • Keywords
    corona; plasma materials processing; polymer films; space charge; surface charging; thermally stimulated currents; thin films; X-ray photoelectron spectroscopy; antistatic process; charge elimination process; charge-elimination process; corona-charged polytetrafluoroethylene thin films; low-pressure discharge plasma; plasma-preprocessed PTFE thin films; space-charge analysis; space-charge density distribution measurement; surface composition; surface-charge analysis; thermally stimulated discharge current measurement; Atomic measurements; Current measurement; Density measurement; Nitrogen; Plasma density; Plasma materials processing; Plasma measurements; Plasma temperature; Plasma x-ray sources; Surface discharges;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.821799
  • Filename
    821799