DocumentCode
1299819
Title
SEU Rates in Atmospheric Environments: Variations Due to Cross-Section Fits and Environment Models
Author
Hands, Alex ; Dyer, Clive S. ; Lei, Fan
Author_Institution
Aerosp. Div., QinetiQ, Farnborough, UK
Volume
56
Issue
4
fYear
2009
Firstpage
2026
Lastpage
2034
Abstract
The wide range in predicted SEU rates in avionics devices is analyzed in relation to fitted device cross-section curves (including thermal neutron sensitivity) and the variation between atmospheric radiation models and current standards.
Keywords
SRAM chips; atmospheric radiation; avionics; measurement standards; neutron effects; SEU rates; SRAM; atmospheric radiation models; avionics devices; cross-section curves; memory devices; single event upset; standards; thermal neutron sensitivity; Aerospace electronics; Atmosphere; Atmospheric modeling; Geomagnetism; Hazards; Helium; Neutrons; Predictive models; Sea level; Single event upset; Atmospheric radiation models and standards; neutron cross-sections; single event upsets;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2013466
Filename
5204697
Link To Document