• DocumentCode
    1300405
  • Title

    Numerical solution of higher order mode cut-off frequencies in symmetric TEM cells using finite element method [EMI measurement applications]

  • Author

    Das, Sisir K. ; Sinha, B.K.

  • Author_Institution
    Center for Electromagn. SAMEER, Madras, India
  • Volume
    32
  • Issue
    4
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    264
  • Lastpage
    268
  • Abstract
    The higher-order-mode cut-off frequencies in symmetric transverse electromagnetic cells are computed with the finite-element method. Transverse electric and transverse magnetic modes are considered. For symmetry, only one-quarter of the cross section is analyzed. Electric and magnetic walls are introduced in the cross section, which includes the effect of the gap between the center conductor and the sidewalls. This arrangement enhances the accuracy of the solution. The results obtained by this method are compared with those of other methods. Discrepancies observed in the results of other methods are explained. The present method is the more powerful one; with this method, mode identification can easily be made using an eigenvector solution
  • Keywords
    cavity resonators; eigenvalues and eigenfunctions; electromagnetic interference; finite element analysis; EMI measurement standards; TE modes; TM modes; eigenvector solution; electric walls; electromagnetic interference; finite element method; higher order mode cut-off frequencies; magnetic walls; mode identification; symmetric TEM cells; transverse electric modes; transverse electromagnetic; transverse magnetic modes; Conductors; Cutoff frequency; Finite element methods; Frequency measurement; Helium; Magnetic analysis; Magnetic field measurement; Resonance; TEM cells; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.59885
  • Filename
    59885