• DocumentCode
    1304758
  • Title

    Interconnects for Novel State Variables: Performance Modeling and Device and Circuit Implications

  • Author

    Rakheja, Shaloo ; Naeemi, Azad

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    57
  • Issue
    10
  • fYear
    2010
  • Firstpage
    2711
  • Lastpage
    2718
  • Abstract
    Fundamental laws of physics will severely limit the “scaling” of silicon FETs beyond the 2020 technology roadmap. There is a need to look for an alternate switching paradigm that can overcome the limitations of the current Si FET technology. Nanoelectronic switches that work with state variables other than electron charge are being investigated by researchers. Some of these post-CMOS technologies hold the promise to extend Moore´s law beyond the technology year 2020. Any new logic that aims at replacing the CMOS logic must be complemented with an interconnect technology that can transmit information encoded in the new computational variable between different physical locations of the chip. The focus of this paper is to map new logic technology with its respective interconnect technology. In this paper, comprehensive physical models of transport mechanisms that can be utilized for novel state variable transport through these novel interconnects are developed. An upper bound on speed of these interconnects is obtained, and a comparison is drawn between novel and CMOS interconnects. A comparison of delay of novel interconnects with CMOS interconnects provides important insights into the material, device, and circuit implications of these new interconnects.
  • Keywords
    CMOS logic circuits; elemental semiconductors; field effect transistor switches; integrated circuit interconnections; nanoelectronics; semiconductor device models; CMOS logic; Si; interconnect technology; nanoelectronic switches; silicon FET; transport mechanisms; CMOS integrated circuits; Delay; Driver circuits; Integrated circuit interconnections; Logic gates; Phonons; Receivers; Alternate state variable; excitons; interconnects; plasmonics; spintronics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2062186
  • Filename
    5557772