An algorithm of diagnostics with signature analyzer

Author

Chan, John C. ; Womack, Baxter F.

Author_Institution

IBM Corp., Austin, TX, USA

Volume

39

Issue

6

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1004

Lastpage

1007

Abstract

The study of faulty signature (checksum) in computer hardware testing is presented. When a faulty signature is observed, it is caused by one of many possible input sequences that contain errors at different locations. The faulty signature is analyzed in order to reduce the number of tests and simplify the fault-isolation process. It is found that the number of errors among the sequences is distributed with binomial characteristics. To support the analysis, a computer simulation is performed to analyze the distributions of undetected errors

Keywords

automatic testing; computer equipment testing; computerised signal processing; digital simulation; error analysis; fault location; logic testing; binomial characteristics; checksum; computer hardware testing; computer simulation; computerised signal processing; diagnostics; distributions of undetected errors; fault-isolation; faulty signature; logic testing; signature analyzer; Algorithm design and analysis; Circuit faults; Circuit testing; Computer errors; Decoding; Fault diagnosis; Hardware; Linear feedback shift registers; Performance analysis; Polynomials;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.65815

Filename

65815