Effectiveness of IC shielded packages against space radiation

Author

Spratt, J.P. ; Passenheim, B.C. ; Leadon, R.E. ; Clark, Capt S. ; Strobel, D.J.

Author_Institution

Full Circle Res. Inc., San Marcos, CA, USA

Volume

44

Issue

6

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

2018

Lastpage

2025

Abstract

This paper discusses research undertaken to evaluate and improve the effectiveness of shielded packages for protecting commercial microelectronics against ionizing dose from electrons and protons in space. The IC shielded package design data base was extended to include all important shield parameters (thickness, atomic number (Z), and edge effects). The shielding effectiveness of these packages was calculated using both forward and adjoint Monte Carlo codes, and the results verified using new methods to simulate omnidirectional electron and proton radiation exposure. Furthermore, a method was developed permitting manufacturers to describe shielded packages in such a way that their effectiveness in any orbit can be quickly and accurately calculated by the user. Finally, it was demonstrated experimentally that shielding with high atomic number shield materials does not increase SEU from proton radiation

Keywords

Monte Carlo methods; electron beam effects; integrated circuit packaging; integrated circuit reliability; proton effects; shielding; space vehicle electronics; IC shielded packages; Monte Carlo codes; SEU; atomic number; electron effects; ionizing dose; omnidirectional radiation exposure; proton effects; shield parameters; space radiation; Atomic measurements; Electronics packaging; Electrons; Integrated circuit packaging; Laboratories; Monte Carlo methods; Orbital calculations; Protection; Protons; Satellites;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.658984

Filename

658984