Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity

Author

Noskov, Yury N.

Author_Institution

Inst. of Res. & Prod., Ferrite Domen Co., St. Petersburg, Russia

Volume

48

Issue

3

fYear

2000

fDate

3/1/2000 12:00:00 AM

Firstpage

329

Lastpage

333

Abstract

In this paper, a method for measuring properties of ceramic materials with relative dielectric constant value of 20-150 is proposed. It permits us to eliminate the operating TM_01δ-mode degeneration due to its frequency coincidence with other modes, including ones of higher order. Both that fact and the possibility of precise calculation of an unloaded quality factor for a cavity permit one to execute the accurate measurements of loss tangent values as low as (1÷0, 5)×10^-4, the error of dielectric constant measurement being equal to or less than 1%. The feasibility of precise measurement of the loaded Q-factor of a cavity by the readings of micrometric probe makes the use of frequency meters unnecessary

Keywords

Q-factor; cavity resonators; ceramics; dielectric loss measurement; microwave measurement; permittivity measurement; TM_01δ-mode degeneration; ceramic materials; cutoff waveguide cavity; dielectric constant measurement; loss tangent values; micrometric probe; relative dielectric constant; unloaded quality factor; Ceramics; Damping; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; High-K gate dielectrics; Loss measurement;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.826830

Filename

826830